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Hardware implementation of a new parallel Fourier transform system using a differential transform matrix
Transactions of IECE Japan, Vol.E66, pp.596-601 (1983, 10)
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Jap. J. Appl.  Phys., Vol.26, pp.L261-L263 (1987, 4)
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Development of a high- speed time-resolved spectroscope and its application to analysis of time-varying optical spectra
IEEE Trans.  Instr.Meas., Vol.IM-36, pp.1045-1049 (1987, 12)
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A holographic measurement of microscopical sliding of electrical contact due to contact spring thermal deformation
IEEE Trans.  Comp., Hybrids, Manuf.Technol., vol.13,pp.20-26 (1990, 3)
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Problems in management information retrieval for high-speed networks and a proposed solution
IEICE Trans.  Commun., E79B, 8, 1054-1060 (1996, 8)
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The Dynamic Symptom Isolation Algorithm for Network Fault Management and Its Evaluation
IEICE Trans. Commun., E81-B, 12, 2471-2480, (1998, 12)
Takumi Mori, Kohei Ohta, Nei Kato, Hideaki Sone, Glenn Mansfield, Yoshiaki Nemoto

Fundamental Study on Effect of Contact Condition for Electromagnetic
Noise at Copper-Carbon Electrodes
IEICE Trans. Electonics, E82-C, 1, 49-54, (1999, 1)
Yasuo EBARA, Toshiaki KOIZUMI, Hideaki SONE, Yoshiaki NEMOTO

Cu-C$BEE5$@\E@$N%"!<%/J|EE$K$h$kEE<'%N%$%:H/@8$HEE6KI=LLJQ2=$N4X78$K4X$9$kpJsDL?.3X2qO@J8;o(B C-II, J82-C-II, 4, 181-189, (1999, 4)
$B9>869/@8!"(B $B>.@t=S>4!"(B $BA>:,=(>O(B

A measurement on electromagnetic noise and change of surface in arcing electric contacts
IEEE Transactions on Components and Packaging Technologies, 23, 2, 293-299, (2000, 2)
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto

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$BEE;R>pJsDL?.3X2qO@J8;o(B, Vol. J83-B, No. 7, pp. 1027-1033 (2000.7)
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Pattern quality evaluation in a TV receiver immunity test using a composite noise generator (CNG)
1984 Int Symp Electromagn Compat (EMC'84),No.17AA2 (Oct,1984),pp.205-210
Nobuo Handa, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi

Automatic measuring system of E-M field pattern for the analyses of E-M environment
Proc ISAP,Vol.'85,No.034-2 (August,1985),pp.185-188
Hiroshi Echigo, Youichi Yamamoto, Hideaki Sone, Tasuku Takagi

Electrode temparature dependency of arc duration, material wear and transfer in bar contacts
Proc. of Int. Conf. on Electr. Contacts, Electromechanical Comp. and Their Appl.,pp.185-194(July,1986).
Tomohiko Sato, Hiroyuki Ishida, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi:

Highspeed time-resolved parallel spectroscopic measurement of contact arc using CCD image sensor
Proc. of IC-CEMCA,pp.929-938(July,1986).
Kiminori Sato, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi:

Automatic data acquisition and processing system of contact phenomena based on advanced microelectronics
Proc. of IC-CEMCA,pp.939-946(July,1986).
Hideaki Sone, Tasuku Takagi:

A novel measurement system for electric contact phenomena using advanced electronic devices
 Proc. of 13th Int. Conf. on Electr. Contacts,pp.427-431 (Sept.,1986).
Hideaki Sone, Tasuku Takagi:

Development of a high speed time-resolved spectroscope and its application to analysis of time-varying optical spectrum
Proc.IEEE Instrum. and Meas. Technol. Conf., pp.259-263(Apr.,1987).
Kiminori Sato, Tomohiko Sato, Hideaki Sone, Tasuku Takagi

Development of a spectroscopic measuring system for time-varying optical spectra using a CCD image sensor
CPEM '88, pp.361-362 (June 1988).
Kiminori Sato, Toshiaki Koizumi, Hideaki Sone, Tasuku Takagi

Real-time digital measurement of electric contact arcing phenomena
Proc. of Int. Conf. on Electrical Contacts and Electromechanical Components pp.543-547 (May, 1989).
Hideaki Sone, Tasuku Takagi

An electromagnetic field pattern measuring technique and its application to analysis of indoor electromagnetic field
EMC'89/Nagoya$B!$(B8a-A3$B!$(Bpp.17-22  (Sept.,1989)
Jian-Qing Wang$B!$(BTsugio Sato$B!$(BHideaki Sone$B!$(BTasuku Takagi

Role of the metallic phase arc discharge on arc erosion in Ag contacts
Proc. 35th IEEE Holm Conf. on Elec. Contacts$B!$(Bpp.79-85  (Sept.,1989)
Hideaki Sone$B!$(BTasuku Takagi

A holographic measurement of microscopical sliding of electrical contact due to spring thermal deformation
Proc. 35th IEEE Holm Conf. on Elec. Contacts$B!$(Bpp.245-252  (Sept.,1989)
Masanari Taniguchi$B!$(BHideaki Sone$B!$(BTasuku Takagi

Electrode temperature dependency on arc and erosion in electric contacts
Proc. 36th IEEE Holm Conf. on Electrical Contacts & 15th Int. Conf. on Electric Conatcts, pp. 33-36 (August 1990).
Hideaki Sone, Hiroyuki Ishida, Tasuku Takagi

Passive electronic components/parts (C/P): Present and future
1993 International Conference Electronic Passive Components, C1 (February 1993).
Hideaki Sone, Tasuku Takagi

Optical surface profile measurement of operating electric contact
1994 IEEE Instrumentation and Measurement Technology Conference, Hamamatsu, THPM5-5, pp. 1341-1344 (May 12, 1994)
Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi

Relationship between bridge and arc phenomena in opening Ag contacts
17th Int Conf on Electrical Contacts, Nagoya, S2-1, pp. 39-43 (July 4, 1994).
Satoru Yamano, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi

An experiment on the dependency of contact opening velocity on arc phenomena of slowly opening Ag and Pd contacts
17th Int Conf on Electrical Contacts, Nagoya, S2-2, pp. 45-50 (July 4, 1994).
Hiroyuki Ishida, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi

Relationship of contact resistance to arc duration in Ag contacts
17th Int Conf on Electrical Contacts, Nagoya, S2-5, pp. 63-67 (July 4, 1994).
Hideaki Sone, Hiroyuki Ishida, Hitoshi Sugimoto, Tasuku Takagi

Relationship between contact resistance and surface profile in arcing Ag contact
17th Int Conf on Electrical Contacts, Nagoya, S3-1, pp. 71-78 (July 4, 1994).
Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi

Experimental study on relationship between bridge and arc phonemena in breaking Ag contacts
40th Holm Conference on Electrical Contacts, Chicago, 2.2, pp. 89-94 (Oct 1994).
Satoru Yamano, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi

A measurement on contact resistance and surface profile of arcing Ag contacts
40th IEEE Holm Conference on Electrical Contacts, Chicago, 2.4, pp. 105-109 (Oct 1994)
Hideaki Sone, Hitoshi Sugimoto, Tasuku Takagi

Divide and Conquer Technique for Network Fault Management
Proceedings of the Fifth IFIP/IEEE International Symposium on Integrated Network Management, 50, 675-687 (1997,5,14)
Kohei Ohta, Takumi Mori, Nei Kato, Hideaki Sone, Glenn Mansfield and Yoshiaki Nemoto

Measurement of arc phenomena in slowly opening Ag and Pd contacts
ICEC'98, 19th International Conference on Electric Contact Phenomena, Nuremberg, Germany (14-17 September, 1998), No. 64, pp.77-81
Hiroyuki Ishida, Hideaki Sone, Shunichi Kono, Tasuku Takagi

An Experimental Study on Correlation between Electromagnetic Noise and Trace of Discharge in Cu-C Electrodes ---Case of C(Anode)--Cu (Cathode)---
1999 International Symposium on Electromagnetic Compatibility (EMC'99 Tokyo), 18P402 (May,1999), pp.122-125.
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto

Measurements of arc phenomena and bridge phenomena in slowly opening Pd
contacts
ICECT'99, International Conference on Electrical Contacts,
Electromechanical Components and Their Applications, Nagoya, 30, pp. 199-204
(July 19-24 1999),
Hiroyuki Ishida, Hideaki Sone, Shunichi Kono, Tasuku Takagi

A Measurement on Electromagnetic Noise and Change of Surface in Arcing Electric Contacts
Proceedings of the 45th IEEE Holm Conference on Electrical Contacts, Pittsburgh, 1.3, pp. 17-23 (Oct 4-6, 1999)
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto

A discussion of electrode temperature dependency of arc duration in Ag and Pd contacts
20th International Conference on Electrical Contacts, Stockholm, no. 2.3, (June 19, 2000)
Hiroyuki Ishida, Hideaki Sone, Masanari Taniguchi, Tasuku Takagi

Correlation between Arcing Phenomena and Electromagnetic Noise of
Opening Electric Contacts
Proceedings of the 46th IEEE Holm Conference on Electrical Contacts, Chicago, pp. 191-197 (Sept, 2000)
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto

An experiment of transmitting regional live pictures by wireless communication system
IEEE Region 10 International Conference on Electrical and Electronic Technology (TENCON 2001), 32.4, pp. 786-791 (August 22 2001)
Masahiro Hiji, Yukinori Konno, Hideaki Sone, Hironori Kanno, Shunichiro Wakiyama

Transition from the Anodic Arc Phase to the Cathodic Metallic Arc Phase in Vacuum at Low DC Electrical Level
47th IEEE Holm Conference on Electrical Contacts, Montreal, 3:3, September 10, 2001
L. Morin, H. Sone, N. Ben Jemaa, D. Jeannot

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